Effects of phase change on reflection in phase-measuring interference microscopy.
نویسنده
چکیده
We show by analytical and numerical calculations that the phase change on reflection that occurs in interference microscopy is almost independent of the numerical aperture of the objective. The shift of the microscope interferogram response due to the phase change on reflection, however, increases with the numerical aperture. Measurements of the interferogram shift are made with a Linnik interference microscope equipped with various numerical-aperture objectives and are reported and compared with theory.
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ورودعنوان ژورنال:
- Applied optics
دوره 43 7 شماره
صفحات -
تاریخ انتشار 2004